Device Lab Facilities


Low Temperature Probe Station

Temperature range capabilities from 3.2 K to 475 K.
1 T horizontal field split pair superconducting magnet.

Cascade Summit 11000 Probe Station for DC and RF measurements (-60C to 300C)

DC and RF measurement capability over a temperature range of - 60C to 300C.
Femtoguard chuck for measuring very low current levels

Agilent PNA for RF measurement (10 MHz to 50 GHz)

On-wafer s-parameter measurement capability from 10 MHz to 50 GHz.
Agilent ADS for RF modeling of transistors and MMICs

Agilent 81150A/DSO9104A for nano sec pulse I-V/C-V measurement

On-wafer ns pulse measurement capability with minimum 5 ns rise time.

Room Temperature Probe Station

HP4156A Semiconductor Parameter Analyzer

HP4285A Precision LCR Meter

LCR Meter; 75 kHz to 30 MHz.

Keithley 6221 Programmable Current Source & 2182A Nanovoltmeter

For low noise conductance measurement.

SR570 - Low-noise Current Preamplifier

For 1/f noise measurements.